Testing and sorting device for electronic components, e.g. IC chips - simultaneously controls blocking pins for several channels of multi-channel component discharge system

摘要

The testing and sorting device has empty containers (13) filled with the tested components, for transporting the latter away in dependence on the obtained component data, via a multi-channel system (2) with several channels for the tested components (3) above a guide rail (11) of the testing and sorting device. A respective control pin is raised and lowered for blocking and releasing the components (3) in each channel. A cam follower (7) associated with each pin selectively contacts an arm (16) attached to a carriage (12) moved along the guide rail (11). The arm (16) and the contacted cam follower (7) are simultaneously raised or lowered via a control plate (20) and a cylinder drive (19) for the latter. ADVANTAGE - Increased reliability and efficiency by eliminating magnetic coil control.