HIGH RESOLUTION OBSERVATION APPARATUS WITH PHOTON HIGH RESOLUTION OBSERVATION APPARATUS WITH PHOTON SCANNING MICROSCOPE SCANNING MICROSCOPE

摘要

A high resolution apparatus for the observation of the properties of a sample material has a photon scanning microscope. The apparatus detects evanescent light emitted from the sample, the intensity of which depends on the surface structure of the sample and the specific distribution of the optical properties thereof. The apparatus provides for the detailed detection of the transparency or refractive index of a sample material in a higher resolution than the wavelength of the incident light, which is irradiated onto the sample material that is applied onto the top surface of an optical prism. The apparatus includes means for maintaining an optical fiber tip, or other means for detecting a positioning signal, at a preselected distance from the sample. Furthermore, the apparatus provides for the detection of fluorescence of the sample.