发明名称 Two-dimensional optical scatterometer apparatus and process
摘要 An optical scatterometer system includes a screen positioned to receive and display a pattern representative of light specularly reflected and scattered from an illuminated sample material and a camera positioned to record the pattern displayed on the screen. The screen may present a curved surface to increase its light gathering capabilities and may be constructed of an electron trapping material, a photochromic material or a pyrochromic material. The screen may contain one or more apertures for passing one or more incident light beams generated by a light source and/or light specularly reflected and scattered from the sample material. The screen may be positioned between the sample material and the light source, or the sample material may be positioned between the screen and the light source.
申请公布号 US5241369(A) 申请公布日期 1993.08.31
申请号 US19900591452 申请日期 1990.10.01
申请人 MCNEIL, JOHN R.;WILSON, SCOTT R. 发明人 MCNEIL, JOHN R.;WILSON, SCOTT R.
分类号 G01B11/30;G01N21/47;G01N21/49;G01N21/55;G01N21/95 主分类号 G01B11/30
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