VORRICHTUNG FUER DIE ELEKTRISCHE FUNKTIONSPRUEFUNG VON VERDRAHTUNGSFELDERN, INSBESONDERE VON LEITERPLATTEN.

摘要

The functional test device choses each measurement point (M1-M7) by an assigned collective line (S1,S2) and an intermediate mask (Z), which prevents the contacting of the non-selected measuring points (M1-M7). The intermediate mask is arranged between the carrier plate (T1,T2) and the wiring panel to be tested. Holes (L1-L7) assigned in the intermediate mask (Z) are applied respectively to the selected measurement points (M1-M7). The measurement points are assinged parallel aligned collective lines (S1,S2) in rows. The collective lines (S1,S2) run transversely to the main directions of the wiring to the wiring panels under test.