| 摘要 |
An impending failure of an electronic circuit caused by aerosol deposition is detected by using a test circuit (21) including a plurality of conducting paths (34a-f), aerosol deposition enhancement means, controllable means to control the aerosol deposition enhancement means, conducting path isolation sensing means (31) to measure the isolation of the conducting paths and control means (33) to supply a control signal to the controllable means and warn of impending test circuit failure responsive to conducting path isolation. In addition, the apparatus includes deliquescence enhancement means which is controllable and responsive to the control signal from the control means. |
