发明名称 |
METHOD OF FABRICATING A MEMORY CELL HAVING SHALLOW JUNCTION |
摘要 |
The method includes the steps of; low concentration source/drain ion injecting into a substrate to form a low concentration source/drain connection, forming insulating layer, polysilicone layer, burying contact between gate and field oxide layer, forming storage node polysilicone layer and heat treating and forming capacitor dielectric layer and plate polysilicone layer, thereby reducing connection depth and connection leakage.
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申请公布号 |
KR940003591(B1) |
申请公布日期 |
1994.04.25 |
申请号 |
KR19910005967 |
申请日期 |
1991.04.13 |
申请人 |
GODLSTAR ELECTRON CO., LTD. |
发明人 |
KIM, DONG - WON;RA, SA - KYUN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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