发明名称 METHOD OF FABRICATING A MEMORY CELL HAVING SHALLOW JUNCTION
摘要 The method includes the steps of; low concentration source/drain ion injecting into a substrate to form a low concentration source/drain connection, forming insulating layer, polysilicone layer, burying contact between gate and field oxide layer, forming storage node polysilicone layer and heat treating and forming capacitor dielectric layer and plate polysilicone layer, thereby reducing connection depth and connection leakage.
申请公布号 KR940003591(B1) 申请公布日期 1994.04.25
申请号 KR19910005967 申请日期 1991.04.13
申请人 GODLSTAR ELECTRON CO., LTD. 发明人 KIM, DONG - WON;RA, SA - KYUN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
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