| 摘要 |
The handler tests the performance of QFP (Quad Flat Package) and PLCC (Plastic Leaded Chip Carrier) semiconductor devices under the constant temperature of about 130 deg.C. The handler includes a feeding means which transfers devices (13) to the tester unit, a moving means which moves the tested device to the transfer unit, a holding means which connects the lead of device to a moving terminal (36) of a socket (32) and a terminal (37), a transmitting means which transfers the tested device by CPU commands. The device prevents the noise and E.U.I., and improves productivity. The device reduces the index time by selection of testing device and tested device.
|
