发明名称 CAPACITOR AND MANUFACTURING METHOD THEREOF
摘要 forming a first conductive layer on a substrate, forming an oxidation stop layer on the first conductive layer, forming a polysilicon layer on the oxidation stop layer; heat-treating the polysilicon layer to form uneven portions on its surface, oxidizing the polysilicon layer to form a silicon oxide layer, etching the oxidation stop layer and silicon oxide layer to selectively expose the first conductive layer; etching the first conductive layer by a predetermined thickness using the oxidation stop layer and silicon oxide layer as a mask' removing the oxidation stop layer and silicon oxide layer; forming a dielectric layer on the surface of the first conductive layer; and forming a second conductive layer thereon.
申请公布号 KR940009628(B1) 申请公布日期 1994.10.15
申请号 KR19910020419 申请日期 1991.11.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KO, JAE - HONG;KIM, SONG - TAE;SHIN, HYON - BO
分类号 H01L21/318;H01L21/02;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/318
代理机构 代理人
主权项
地址