发明名称 |
CAPACITOR AND MANUFACTURING METHOD THEREOF |
摘要 |
forming a first conductive layer on a substrate, forming an oxidation stop layer on the first conductive layer, forming a polysilicon layer on the oxidation stop layer; heat-treating the polysilicon layer to form uneven portions on its surface, oxidizing the polysilicon layer to form a silicon oxide layer, etching the oxidation stop layer and silicon oxide layer to selectively expose the first conductive layer; etching the first conductive layer by a predetermined thickness using the oxidation stop layer and silicon oxide layer as a mask' removing the oxidation stop layer and silicon oxide layer; forming a dielectric layer on the surface of the first conductive layer; and forming a second conductive layer thereon.
|
申请公布号 |
KR940009628(B1) |
申请公布日期 |
1994.10.15 |
申请号 |
KR19910020419 |
申请日期 |
1991.11.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KO, JAE - HONG;KIM, SONG - TAE;SHIN, HYON - BO |
分类号 |
H01L21/318;H01L21/02;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/318 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|