发明名称 Method for manufacturing semiconductor integrated circuit device
摘要 A semiconductor integrated circuit according to the present invention comprises a semiconductor substrate, a plurality of MOS field effect transistors each formed on a surface region of the semiconductor substrate and having source and drain regions, a gate insulating film formed on a region between the source and drain regions, and a gate electrode formed on the gate insulating film. The gate electrode includes a polycrystalline SiGe-mixed crystal which is expressed by Si1-xGex (1>x>0).
申请公布号 US5356821(A) 申请公布日期 1994.10.18
申请号 US19930104907 申请日期 1993.08.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NARUSE, HIROSHI;TAKA, SHIN-ICHI
分类号 H01L27/092;H01L21/8238;H01L21/8248;H01L21/8249;H01L27/06;H01L29/49;H01L29/737;(IPC1-7):H01L21/265 主分类号 H01L27/092
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