发明名称 X-ray examination apparatus.
摘要 <p>Absorption filters (11) are positioned in an x-ray examination apparatus by adjusting them on the basis of the posture of the carrier (1) supporting the x-ray source (2) and the x-ray detector (3). To that end adjustment curves relating carrier posture to filter adjustment are employed. The posture of the carrier determines the orientation of the x-ray beam path. Because there are relatively few anatomical differences among patients to be examined, the adjustment of absorption filters on the basis of the beam orientation is quite adequate. Further improvement is achieved by providing sets of adjustment curves, each set pertaining to a class of patients, such as e.g. corpulent or slender patients, or infants or adults. &lt;IMAGE&gt;</p>
申请公布号 EP0627198(A1) 申请公布日期 1994.12.07
申请号 EP19940200572 申请日期 1994.03.07
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 HOORNAERT, BART PIERRE ANTOINE JOZEF;VAN BENTHEM, ADRIANUS CORNELIS
分类号 A61B6/00;(IPC1-7):A61B6/00 主分类号 A61B6/00
代理机构 代理人
主权项
地址