发明名称 |
An automatic wafer etching method and apparatus. |
摘要 |
<p>An automatic wafer etching apparatus including a first elevator (33) and a second elevator (34) each having a top surface whose vertical cross-section is circularly concaved having a curvature equal to that of the wafers and adapted to reciprocate vertically such that the top surface can pass through the etching drum (31), and an etching drum having a main housing consisting of a pair of vertical parallel side plates opposing each other, a horizontal shaft integral with the main housing side plates; a plurality of rollers borne between the main housing side plates in a manner such that they are freely rotatory; the rollers having annular grooves in their surfaces to receive edges of wafers in a manner such that the wafers are supported vertically at suitable intervals in a horizontal row; small-diameter gears locked at those ends of the rollers. <IMAGE></p> |
申请公布号 |
EP0657920(A1) |
申请公布日期 |
1995.06.14 |
申请号 |
EP19950100530 |
申请日期 |
1992.06.01 |
申请人 |
SHIN-ETSU HANDOTAI COMPANY LIMITED |
发明人 |
HASEGAWA, FUMIHIKO;SATO, SHINJI |
分类号 |
H01L21/00;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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