发明名称 |
EUV radiation system and lithographic apparatus |
摘要 |
A lithographic projection apparatus is provided with a EUV radiation system that includes a source chamber, a supply constructed and arranged to supply a target material to a predetermined plasma formation position, an optical system formed by three or more mirrors arranged to establish a beam path extending to the target material when the target material is located at the predetermined plasma formation position, and a laser system constructed and arranged to provide a laser beam along the beam path for interaction with the target material to produce an EUV radiation-emitting plasma inside the chamber. |
申请公布号 |
US9523921(B2) |
申请公布日期 |
2016.12.20 |
申请号 |
US201013390290 |
申请日期 |
2010.07.14 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
Van Dijsseldonk Antonius Johannes Josephus;Loopstra Erik Roelof |
分类号 |
G03B27/54;G03F7/20;H05G2/00 |
主分类号 |
G03B27/54 |
代理机构 |
Pillsbury Winthrop Shaw Pittman LLP |
代理人 |
Pillsbury Winthrop Shaw Pittman LLP |
主权项 |
1. An EUV radiation system comprising:
a source chamber; a supply constructed and arranged to supply a target material to a predetermined plasma formation position; an optical system formed by three or more mirrors arranged to establish a beam path extending to the target material when the target material is located at the predetermined plasma formation position, wherein three of said mirrors form a three-mirror anastigmat constructed and arranged to at least reduce an amount of astigmatism in a focal point of the optical system, and wherein reflective surfaces of the three of said mirrors are off-axis sections of rotationally symmetric conic surfaces; and a laser system constructed and arranged to provide a laser beam along the beam path such that the laser beam is focused by a final one of the mirrors at the predetermined plasma formation position for interaction with the target material to produce an EUV radiation-emitting plasma inside the chamber. |
地址 |
Veldhoven NL |