发明名称 EUV radiation system and lithographic apparatus
摘要 A lithographic projection apparatus is provided with a EUV radiation system that includes a source chamber, a supply constructed and arranged to supply a target material to a predetermined plasma formation position, an optical system formed by three or more mirrors arranged to establish a beam path extending to the target material when the target material is located at the predetermined plasma formation position, and a laser system constructed and arranged to provide a laser beam along the beam path for interaction with the target material to produce an EUV radiation-emitting plasma inside the chamber.
申请公布号 US9523921(B2) 申请公布日期 2016.12.20
申请号 US201013390290 申请日期 2010.07.14
申请人 ASML NETHERLANDS B.V. 发明人 Van Dijsseldonk Antonius Johannes Josephus;Loopstra Erik Roelof
分类号 G03B27/54;G03F7/20;H05G2/00 主分类号 G03B27/54
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. An EUV radiation system comprising: a source chamber; a supply constructed and arranged to supply a target material to a predetermined plasma formation position; an optical system formed by three or more mirrors arranged to establish a beam path extending to the target material when the target material is located at the predetermined plasma formation position, wherein three of said mirrors form a three-mirror anastigmat constructed and arranged to at least reduce an amount of astigmatism in a focal point of the optical system, and wherein reflective surfaces of the three of said mirrors are off-axis sections of rotationally symmetric conic surfaces; and a laser system constructed and arranged to provide a laser beam along the beam path such that the laser beam is focused by a final one of the mirrors at the predetermined plasma formation position for interaction with the target material to produce an EUV radiation-emitting plasma inside the chamber.
地址 Veldhoven NL