| 摘要 |
<p>A device (100) comprises an analog-to-digital converter (200), a digital signal processor (500), a digital dither signal generator (400), and a signal coupling device (300) adapted to selectively couple one of the dither signal generator (400) and the digital signal processor (500) to the signal path in the converter (200). A method of testing a dithered analog-to-digital converter (200) employing an M-bit digital dither signal generator (400), M being a positive integer, comprises the steps of: generating an M-bit, periodic signal, providing the generated signal to the dithered converter (200) at a point along the signal path of the dithered converter in place of the dither signal, and measuring the digital output signal produced by the converter (200). <IMAGE></p> |
