Structure de test de circuit intégré.

摘要

The present invention relates to an integrated circuit in which at least one access terminal (1) is linked to an element (4) of an internal circuit (3) via a capacitor consisting of two portions of conducting layers which are opposite each other and insulated from each other. The lower conducting layer portion (21) is linked to the terminal and the upper conducting layer portion (25) is linked to the said element. Thus the upper conducting layer portion (25) can form a direct-current test terminal.