发明名称 |
Filter device with memory test circuit |
摘要 |
A filter device with memory test circuit easily executes a memory test inspite of single-bit data processing to 1 bit data. The filter device with a memory test circuit includes a memory test circuit between a memory means and a shift register, sequentially reads digital data and tests digital data at the external Central Processing Unit (CPU) after converting the data from parallel to serial at the shift register.
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申请公布号 |
US5500810(A) |
申请公布日期 |
1996.03.19 |
申请号 |
US19940231766 |
申请日期 |
1994.04.25 |
申请人 |
YOZAN INC.;SHARP CORPORATION |
发明人 |
SHOU, GUOLIANG;YANG, WEIKANG;TAKATORI, SUNAO;YAMAMOTO, MAKOTO |
分类号 |
H03H15/00;H03H17/02;(IPC1-7):G06F15/31 |
主分类号 |
H03H15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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