发明名称 Filter device with memory test circuit
摘要 A filter device with memory test circuit easily executes a memory test inspite of single-bit data processing to 1 bit data. The filter device with a memory test circuit includes a memory test circuit between a memory means and a shift register, sequentially reads digital data and tests digital data at the external Central Processing Unit (CPU) after converting the data from parallel to serial at the shift register.
申请公布号 US5500810(A) 申请公布日期 1996.03.19
申请号 US19940231766 申请日期 1994.04.25
申请人 YOZAN INC.;SHARP CORPORATION 发明人 SHOU, GUOLIANG;YANG, WEIKANG;TAKATORI, SUNAO;YAMAMOTO, MAKOTO
分类号 H03H15/00;H03H17/02;(IPC1-7):G06F15/31 主分类号 H03H15/00
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