发明名称 |
Spring-loaded electrical contact probe |
摘要 |
An electrical spring probe includes a barrel having an annular opening therethrough. A plunger is partially disposed within the annular opening at one end and is capable of slidable axial displacement within the annular opening. The plunger includes a tip positioned outside of the barrel for contacting an electrical device. A terminal member is disposed within the annular opening through the barrel at an end opposite to the plunger and is fixedly attached therein. The terminal member includes a flanged end that is positioned outside of the barrel and includes at least one flange that extends radially outward from the flanged end. The flange has a shoulder that is substantially perpendicular to an axis running along the terminal member. A slot is positioned in the flanged end and extends axially along the terminal member from tip of the flanged end a distance toward the barrel. The spring probe forms a locked attachment with a probe receptacle by a snap locking abutment of the shoulder of each flange with an outside edge of an opening in a terminal portion of the receptacle.
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申请公布号 |
US5557213(A) |
申请公布日期 |
1996.09.17 |
申请号 |
US19940348565 |
申请日期 |
1994.12.01 |
申请人 |
EVERETT CHARLES TECHNOLOGIES, INC. |
发明人 |
REUTER, MARK S.;GERANIS, JOHN A. |
分类号 |
G01R1/067;(IPC1-7):G01R1/06 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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