发明名称 |
POWER SUPPLY VOLTAGE DETECTION CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND ELECTRONIC DEVICE |
摘要 |
A power supply voltage detection circuit can detect the power supply voltage obtained by stabilizing a power supply voltage supplied from outside and also the magnitude of the power supply voltage before being stabilized. This power supply voltage detection circuit includes a selection circuit that selects one power supply potential from among a plurality of power supply potentials including a first power supply potential supplied from outside and a second power supply potential obtained by stabilizing the first power supply potential, a variable voltage dividing circuit that divides the voltage between the power supply potential selected by the selection circuit and a reference potential by a set division ratio, a comparison voltage generation circuit that generates a comparison voltage based on a reference voltage, and a comparator that compares the voltage divided by the variable voltage dividing circuit with the comparison voltage and outputs a signal representing a comparison result. |
申请公布号 |
US2016378129(A1) |
申请公布日期 |
2016.12.29 |
申请号 |
US201615172932 |
申请日期 |
2016.06.03 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
ABE Sachiyuki |
分类号 |
G05F3/02;H03K5/24;H01L27/02 |
主分类号 |
G05F3/02 |
代理机构 |
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代理人 |
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主权项 |
1. A power supply voltage detection circuit comprising:
a selection circuit that selects one power supply potential from among a plurality of power supply potentials including a first power supply potential supplied from outside and a second power supply potential obtained by stabilizing the first power supply potential; a variable voltage dividing circuit that divides a voltage between the power supply potential selected by the selected selection circuit and a reference potential by a set division ratio; a comparison voltage generation circuit that generates a comparison voltage based on the reference voltage; and a comparator that outputs a signal representing a comparison result, by comparing the voltage divided by the variable voltage dividing circuit with the comparison voltage. |
地址 |
Tokyo JP |