发明名称 POWER SUPPLY VOLTAGE DETECTION CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND ELECTRONIC DEVICE
摘要 A power supply voltage detection circuit can detect the power supply voltage obtained by stabilizing a power supply voltage supplied from outside and also the magnitude of the power supply voltage before being stabilized. This power supply voltage detection circuit includes a selection circuit that selects one power supply potential from among a plurality of power supply potentials including a first power supply potential supplied from outside and a second power supply potential obtained by stabilizing the first power supply potential, a variable voltage dividing circuit that divides the voltage between the power supply potential selected by the selection circuit and a reference potential by a set division ratio, a comparison voltage generation circuit that generates a comparison voltage based on a reference voltage, and a comparator that compares the voltage divided by the variable voltage dividing circuit with the comparison voltage and outputs a signal representing a comparison result.
申请公布号 US2016378129(A1) 申请公布日期 2016.12.29
申请号 US201615172932 申请日期 2016.06.03
申请人 SEIKO EPSON CORPORATION 发明人 ABE Sachiyuki
分类号 G05F3/02;H03K5/24;H01L27/02 主分类号 G05F3/02
代理机构 代理人
主权项 1. A power supply voltage detection circuit comprising: a selection circuit that selects one power supply potential from among a plurality of power supply potentials including a first power supply potential supplied from outside and a second power supply potential obtained by stabilizing the first power supply potential; a variable voltage dividing circuit that divides a voltage between the power supply potential selected by the selected selection circuit and a reference potential by a set division ratio; a comparison voltage generation circuit that generates a comparison voltage based on the reference voltage; and a comparator that outputs a signal representing a comparison result, by comparing the voltage divided by the variable voltage dividing circuit with the comparison voltage.
地址 Tokyo JP
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