发明名称 Integrated circuit wafer protection method for vacuum processing
摘要 The method involves covering the active face of the integrated circuit wafer with a protective layer of a chemically stable isolating material before processing stages. The coating is thicker near the contact pads to provide reserves of material, with openings provided above the contacts. Ink drops are used to mark individual integrated circuits that are not functional. A preliminary coating is applied before the main coating, to provide a smooth surface for the main coating.
申请公布号 FR2750250(A1) 申请公布日期 1997.12.26
申请号 FR19960007680 申请日期 1996.06.20
申请人 SOLAIC 发明人 SIETTLER SOPHIE;AUDOUX JEAN NOEL
分类号 H01L21/56;H01L21/60;H01L21/78;(IPC1-7):H01L21/78;H01L23/28 主分类号 H01L21/56
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