Verfahren zur Analyse eines Prozeßzustandes einer technischen Anlage,申请号DE19961035033-传众专利搜索

发明名称	Verfahren zur Analyse eines Prozeßzustandes einer technischen Anlage
摘要	In order to achieve particularly quick and easy analysis of a process state, especially precise assessment of the effects of a malfunction on the entire process of a technical installation (1), the invention discloses a performance characteristic (L1 to LM) characterizing a selected part (A1 to Am) of the installation (1) determined by means of a number of process signals (PS) pertaining to the selected installation part (A1 to Am) and by means of performance characteristics (L1 to Lm) associated with the other installation parts (A1 to Am) interacting with the selected installation part (A1 to AM).
申请公布号	DE19635033(A1)	申请公布日期	1998.03.12
申请号	DE19961035033	申请日期	1996.08.29
申请人	SIEMENS AG, 80333 MUENCHEN, DE	发明人	MEDERER, HANS-GERD, DIPL.-PHYS., 91052 ERLANGEN, DE;POLITIADIS-BEHRENS, ALEXANDER, DIPL.-ING. (FH), 91315 HOECHSTADT, DE;ILMENBERGER, HERMANN, DIPL.-INFORM., 83052 BRUCKMUEHL, DE;SCHMITZ, JUERGEN, DIPL.-INFORM., 85658 EGMATING, DE;THUERMEL, SABINE, DR.RER.NAT., 82031 GRUENWALD, DE;REICH, MATTHIAS, DIPL.-INFORM., 81737 MUENCHEN, DE
分类号	F01K13/02;G05B23/02;(IPC1-7):G05B23/02;G05B15/02;F01K13/00	主分类号	F01K13/02
代理机构		代理人
主权项
地址