发明名称 Structure and method for semiconductor device
摘要 A semiconductor device and method of forming the same is disclosed. The semiconductor device includes a substrate having first and second device regions. The first device region includes a first source/drain (S/D) region and the second device region includes a plurality of second S/D regions. The semiconductor device further includes a plurality of first recesses in the first S/D region and a plurality of second recesses, one in each of the second S/D regions. The semiconductor device further includes a first epitaxial feature having bottom portions and a top portion, wherein each of the bottom portions is in one of the first recesses and the top portion is over the first S/D region. The semiconductor device further includes a plurality of second epitaxial features each having a bottom portion in one of the second recesses. The second epitaxial features separate from each other.
申请公布号 US9484265(B2) 申请公布日期 2016.11.01
申请号 US201615063694 申请日期 2016.03.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Lee Yi-Jing;Li Chii-Horng;Li Kun-Mu;Lee Tze-Liang
分类号 H01L29/66;H01L21/8238;H01L29/78;H01L29/165;H01L29/167;H01L21/306;H01L21/02;H01L29/417;H01L27/11;H01L27/092 主分类号 H01L29/66
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method of forming a semiconductor device, comprising: providing a semiconductor substrate with first and second device regions, wherein the first device region includes a first source/drain (S/D) region and the second device region includes a plurality of second S/D regions; etching a plurality of first recesses in the first S/D region and a plurality of second recesses in the second S/D regions; growing a first plurality of first epitaxial features in the first recesses and a second plurality of first epitaxial features in the second recesses; and growing a third plurality of second epitaxial features over the first plurality and a fourth plurality of second epitaxial features over the second plurality, wherein the first and third epitaxial features are different, and the second and fourth epitaxial features are different.
地址 Hsin-Chu TW