发明名称 |
Structure and method for semiconductor device |
摘要 |
A semiconductor device and method of forming the same is disclosed. The semiconductor device includes a substrate having first and second device regions. The first device region includes a first source/drain (S/D) region and the second device region includes a plurality of second S/D regions. The semiconductor device further includes a plurality of first recesses in the first S/D region and a plurality of second recesses, one in each of the second S/D regions. The semiconductor device further includes a first epitaxial feature having bottom portions and a top portion, wherein each of the bottom portions is in one of the first recesses and the top portion is over the first S/D region. The semiconductor device further includes a plurality of second epitaxial features each having a bottom portion in one of the second recesses. The second epitaxial features separate from each other. |
申请公布号 |
US9484265(B2) |
申请公布日期 |
2016.11.01 |
申请号 |
US201615063694 |
申请日期 |
2016.03.08 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Lee Yi-Jing;Li Chii-Horng;Li Kun-Mu;Lee Tze-Liang |
分类号 |
H01L29/66;H01L21/8238;H01L29/78;H01L29/165;H01L29/167;H01L21/306;H01L21/02;H01L29/417;H01L27/11;H01L27/092 |
主分类号 |
H01L29/66 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method of forming a semiconductor device, comprising:
providing a semiconductor substrate with first and second device regions, wherein the first device region includes a first source/drain (S/D) region and the second device region includes a plurality of second S/D regions; etching a plurality of first recesses in the first S/D region and a plurality of second recesses in the second S/D regions; growing a first plurality of first epitaxial features in the first recesses and a second plurality of first epitaxial features in the second recesses; and growing a third plurality of second epitaxial features over the first plurality and a fourth plurality of second epitaxial features over the second plurality, wherein the first and third epitaxial features are different, and the second and fourth epitaxial features are different. |
地址 |
Hsin-Chu TW |