发明名称 Method and system for analyzing particles in cold plasma
摘要 The invention relates to a method of analyzing particles, in particular particles of diameter less than 1 μm, the method comprising the following steps: firing laser shots into a cold plasma (45) at low pressure;using an optical spectrometer device (60) to acquire emission spectra of the light emitted by the plasma as a result of the laser shots, in such a manner that for each acquired spectrum, an acquisition period begins no later than 100 ns after firing the laser shot; andanalyzing the particles present in the plasma on the basis of the emission spectra.;A system for detecting and/or analyzing particles by performing the method.
申请公布号 US9506868(B2) 申请公布日期 2016.11.29
申请号 US201314431727 申请日期 2013.09.27
申请人 Centre National De La Recherche Scientifique;Universite D'Orleans 发明人 Boufendi Laïfa;Meyer Laurent;Dutouquet Christophe;Frejafon Emeric;Wattieaux Gaétan
分类号 G01J3/30;G01N21/71;H05H1/00 主分类号 G01J3/30
代理机构 Lee & Hayes, PLLC 代理人 Lee & Hayes, PLLC
主权项 1. An analysis method for analyzing particles, in particular particles of diameter less than 1 μm, the method comprising the following steps: a) providing a cold plasma at a pressure less than 10 mbar; b) firing laser shots into the cold plasma; c) using an optical spectrometer device to acquire emission spectra of the light emitted by the plasma as a result of the laser shots, in such a manner that for each acquired spectrum, an acquisition period begins no later than 100 ns after firing the laser shot; and d) analyzing the particles present in the plasma on the basis of said emission spectra.
地址 Paris FR