发明名称 |
Method and system for analyzing particles in cold plasma |
摘要 |
The invention relates to a method of analyzing particles, in particular particles of diameter less than 1 μm, the method comprising the following steps:
firing laser shots into a cold plasma (45) at low pressure;using an optical spectrometer device (60) to acquire emission spectra of the light emitted by the plasma as a result of the laser shots, in such a manner that for each acquired spectrum, an acquisition period begins no later than 100 ns after firing the laser shot; andanalyzing the particles present in the plasma on the basis of the emission spectra.;A system for detecting and/or analyzing particles by performing the method. |
申请公布号 |
US9506868(B2) |
申请公布日期 |
2016.11.29 |
申请号 |
US201314431727 |
申请日期 |
2013.09.27 |
申请人 |
Centre National De La Recherche Scientifique;Universite D'Orleans |
发明人 |
Boufendi Laïfa;Meyer Laurent;Dutouquet Christophe;Frejafon Emeric;Wattieaux Gaétan |
分类号 |
G01J3/30;G01N21/71;H05H1/00 |
主分类号 |
G01J3/30 |
代理机构 |
Lee & Hayes, PLLC |
代理人 |
Lee & Hayes, PLLC |
主权项 |
1. An analysis method for analyzing particles, in particular particles of diameter less than 1 μm, the method comprising the following steps:
a) providing a cold plasma at a pressure less than 10 mbar; b) firing laser shots into the cold plasma; c) using an optical spectrometer device to acquire emission spectra of the light emitted by the plasma as a result of the laser shots, in such a manner that for each acquired spectrum, an acquisition period begins no later than 100 ns after firing the laser shot; and d) analyzing the particles present in the plasma on the basis of said emission spectra. |
地址 |
Paris FR |