发明名称 Method and apparatus for calibrating integrated circuit analog-to-digital converters
摘要 The calibration method preferably comprises the steps of: driving the analog-to-digital converter (ADC) with at least one test signal; calibrating the driven ADC over a series of successive ADC calibrations; generating a series of successive ADC figure of merit measurements for respective successive ADC calibrations, the series of successive ADC figure of merit measurements defining at least a portion of a curve having a local minimum/maximum; and stopping calibrating at an ADC calibration corresponding to the local minimum/maximum of the curve defined by the series of successive ADC figure of merit measurements. The step of calibrating preferably comprises incrementally calibrating the ADC over the series of successive ADC calibrations. The method preferably further comprises the step of determining the local minimum/maximum of the curve. In particular, the step of determining preferably comprises fitting an equation to the series of ADC figure of merit measurements; and calculating the local minimum/maximum based upon the equation. Of course, the step of fitting the equation preferably comprises fitting the equation based upon a predetermined number of prior ADC figure of merit measurements. The step of fitting the equation may comprise fitting a polynomial equation, such as a third order equation, to the series of ADC figure of merit measurements. In addition, the step of calculating the local minimum/maximum may preferably comprise calculating a first derivative of the equation.
申请公布号 US5861826(A) 申请公布日期 1999.01.19
申请号 US19970885273 申请日期 1997.06.30
申请人 HARRIS CORPORATION 发明人 SHU, TZI-HSIUNG;VON DOLTEREN, GEORGE E.
分类号 H03M1/10;H03M1/12;H03M1/66;(IPC1-7):H03M1/10 主分类号 H03M1/10
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