发明名称 Method for forming a capacitor in a memory cell in a dynamic random access memory device
摘要 In a method for forming an annular-shaped and vertically extending bottom electrode of a memory cell capacitor, a conductive film is formed on an inter-layer insulator. A photo-resist material is applied on the conductive film to form a photo-resist film thereon. The photo-resist film is patterned by a photo-lithography using a mask which includes a transparent plate-like body and a phase shifting film selectively provided on a predetermined region of the transparent plate-like body to form an annular-shaped and vertically extending photo-resist pattern over the conductive film. The conductive film is subjected to an anisotropic etching, in which the annular-shaped and vertically extending photo-resist pattern is used as a mask, to form an annular-shaped and vertically extending bottom electrode under the annular-shaped and vertically extending photo-resist pattern. The annular-shaped and vertically extending photo-resist pattern is removed.
申请公布号 US5897983(A) 申请公布日期 1999.04.27
申请号 US19960655568 申请日期 1996.05.30
申请人 NEC CORPORATION 发明人 HIROTA, TOSHIYUKI;KUROKAWA, TOMOMI;ZENKE, MASANOBU;YOKOTA, KAZUKI
分类号 G03F7/20;H01L21/02;H01L21/027;H01L21/822;H01L21/8242;H01L27/04;H01L27/108;(IPC1-7):G03C5/00 主分类号 G03F7/20
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