发明名称 |
Method for forming a capacitor in a memory cell in a dynamic random access memory device |
摘要 |
In a method for forming an annular-shaped and vertically extending bottom electrode of a memory cell capacitor, a conductive film is formed on an inter-layer insulator. A photo-resist material is applied on the conductive film to form a photo-resist film thereon. The photo-resist film is patterned by a photo-lithography using a mask which includes a transparent plate-like body and a phase shifting film selectively provided on a predetermined region of the transparent plate-like body to form an annular-shaped and vertically extending photo-resist pattern over the conductive film. The conductive film is subjected to an anisotropic etching, in which the annular-shaped and vertically extending photo-resist pattern is used as a mask, to form an annular-shaped and vertically extending bottom electrode under the annular-shaped and vertically extending photo-resist pattern. The annular-shaped and vertically extending photo-resist pattern is removed.
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申请公布号 |
US5897983(A) |
申请公布日期 |
1999.04.27 |
申请号 |
US19960655568 |
申请日期 |
1996.05.30 |
申请人 |
NEC CORPORATION |
发明人 |
HIROTA, TOSHIYUKI;KUROKAWA, TOMOMI;ZENKE, MASANOBU;YOKOTA, KAZUKI |
分类号 |
G03F7/20;H01L21/02;H01L21/027;H01L21/822;H01L21/8242;H01L27/04;H01L27/108;(IPC1-7):G03C5/00 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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