| 摘要 |
A dynamic random access memory (DRAM) classification method is disclosed, including a test/classification apparatus controlled by a test/classification control process. The test/classification apparatus includes a programmable logic control (PLC), test devices, a conveyor device, electromagnetic driver devices, a man-machine interface, sensors and an alarm. The PLC is operated in accordance with the test/classification control process to control the test devices for performing test on DRAMs supplied from at least two supply rails. The electromagnetic driver devices are then used to move the DRAMs so tested to the conveyor device which in turn conveys the DRAMs to a particular collection position in accordance with the characteristic value obtained in the test, which characteristic value being within a particular class of DRAM associated with such a particular collection position, to achieve conveyance and classification of the DRAM. The man-machine interface provides a manual control and access to the steps of the test/classification control process of the DRAM. The sensors and the alarm are to detect the condition of out-of-supply of DRAM and to provide a warning of the out-of-supply condition.
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