发明名称 INSPECTION METHOD AND MEASUREMENT DEVICE FOR CATHODE- RAY TUBE AND ELECTRON GUN THEREOF, AND MANUFACTURING SYSTEM FOR CATHODE-RAY TUBE
摘要 PROBLEM TO BE SOLVED: To provide a cathode-ray tube having a structure capable of inspecting an electron gun before assembled to the cathode-ray tube without deteriorating the cathode or the like. SOLUTION: This cathode-ray tube is constituted by integrally joining a neck part 1 storing an electron gun 2 and a cone part 6, and the neck part 1 has a valve 3 capable of opening and closing from the outside. This valve 3 seals the inside of the neck part 2 when it is closed and passes electron beams from the electron gun 1 when it is opened. In this way, before assembled to the cathode-ray tube, the neck part 1 can be attached to an inspection device for the electron gun 2 in order to perform a focus check or the like on the electron gun 2. In this case, the neck part 1 is attached to the inspection device, and then the valve 3 is opened so as to be in a high vacuum state. Accordingly, electron beams can be generated by driving the electron gun 2. After completion of the inspection, the valve 3 is closed so that the neck part 1 is held in a high vacuum state, where the neck part 1 is integrally assembled to the cone part 6.
申请公布号 JP2000048722(A) 申请公布日期 2000.02.18
申请号 JP19980215944 申请日期 1998.07.30
申请人 HITACHI LTD 发明人 NOZAKI YOSHINAO;OBARA KENJI;MOCHIZUKI ATSUSHI;DOI HIDEAKI;KOGANEZAWA NOBUYUKI
分类号 H01J9/42;H01J29/48;H01J29/86;(IPC1-7):H01J9/42 主分类号 H01J9/42
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