| 摘要 |
PROBLEM TO BE SOLVED: To provide a bit map data generating apparatus and a method for an IC tester, capable of generating bit map data at high speed without reading out data itself recorded in a defect analysis memory. SOLUTION: A defect analysis memory retrieved section 3B of a defect analysis memory section 3A provided in a main body 3 of an IC tester continuously retrieves a changing point in data indicating whether each bit is defective or not, to obtain an address corresponding to the changing point from a defect analysis memory 3C. A bit map data generating section 2B provided in a control device 2 of the IC tester sequentially generates bit map data in accordance with progress of a predetermined address sequence, and further generates a bit map data file by inverting a logic value of the bit map data in accordance with the address obtained by the defect analysis memory retrieval section 3B.
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