发明名称 |
METHOD FOR MANUFACTURING FLOATING GATE OF NON-VOLATILE MEMORY DEVICE |
摘要 |
<p>PURPOSE: A method for manufacturing a floating gate is provided to improve the endurance of a non-volatile memory device by making a tip of the floating gate uniform and increasing the quality of an insulation layer between a control gate and the floating gate. CONSTITUTION: The method for manufacturing a floating gate comprises the steps of: forming a first conduction layer on a semiconductor substrate having an insulation layer; forming a native oxidation layer formed on the first conduction layer; forming a second conduction layer on the first conduction layer; forming a first gate electrode by etching a predetermined part of the first and second conduction layer; forming an insulation layer on the semiconductor substrate including sides of the first gate electrode; and forming a second gate electrode on a predetermined region of the insulation layer.</p> |
申请公布号 |
KR20000013297(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980032063 |
申请日期 |
1998.08.06 |
申请人 |
SAMSUNG ELECTRICS CO., LTD. |
发明人 |
JO, UI SEONG |
分类号 |
H01L21/8246;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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