发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PURPOSE: A semiconductor device and a method for manufacturing the same are provided to improve reliability of the device by securing a sufficient channel length in a limited area. CONSTITUTION: A semiconductor devide includes an oxide film(22) on a semiconductor substrate(21) of a concave-convex shape. The first polysilicon layer(23) as a planarization layer is formed on the oxide film(22). A field oxide film(24) is formed in a field region of the first polysilicon layer(23). A gate oxide film(25) and a gate electrode(26a) are formed in the active region. A source/drain impurity diffusion region(28) is formed within the surface of the first polysilicon layer(23) at both sides of the gate electrode(26a).
申请公布号 KR100252849(B1) 申请公布日期 2000.04.15
申请号 KR19970049213 申请日期 1997.09.26
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 JONG, SHIN YONG
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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