发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To reduce a circuit scale and to reduce current consumption when an erroneous write-in preventive circuit charging a bit line is provided for preventing that a memory cell unnecessary of write-in is erroneously written in due to wiring capacitance between adjacent bit lines in an SRAM using a four Tr(transistor) memory cell. SOLUTION: The erroneous write-in preventive circuit 10 is constituted of N type Trs of Q13-Q18, a P type Tr of a Q19 and diodes D1-D6. Thus, in the erroneous write-in preventive circuit 10, whether or not the bit line is charged according to the potential of the adjacent bit lines is decided, and the bit line of no probability erroneously written in isn't charged, and only the bit line of the probability erroneously written in is charged. Thus, an excess current doesn't flow.
申请公布号 JP2000137987(A) 申请公布日期 2000.05.16
申请号 JP19980310588 申请日期 1998.10.30
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 SERIZAWA KENICHI
分类号 G11C11/417;G11C11/412;G11C29/02;(IPC1-7):G11C11/417 主分类号 G11C11/417
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