发明名称 LSI TESTER WITH LIGHT SOURCE
摘要 PROBLEM TO BE SOLVED: To provide an LSI tester with a light source for improved measurement performance and reduced size by shielding an irradiation light from a light source, with a simple configuration from the outside light. SOLUTION: A light source part 43 for irradiating a measurement device, a test head 41, and a performance board 4, are provided. Here, a through-hole 42 provided at the central part of the test head 41, the light source part 43 provided in the through-hole 42, a light-shielding cylinder which shields the light projected to the measurement device from the light source part 43 of the test head 41 provided at the performance board 4 from an external light, are provided.
申请公布号 JP2000147065(A) 申请公布日期 2000.05.26
申请号 JP19980319095 申请日期 1998.11.10
申请人 YOKOGAWA ELECTRIC CORP 发明人 GOI NORIYUKI
分类号 G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/26
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