发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To manufacture a semiconductor device in less processes with high accuracy wherein a pMOS transistor and nMOS transistor are provided on the same substrate with a first conductive type transistor's gate electrode which is a first conductive type, while a second conductive type transistor's gate electrode which is a second conductive type. SOLUTION: After a first silicon film 16 is deposited with boron which is a doped p-type impurity, a non-doped second silicon film 17 is deposited, forming a two-layer gate electrode. Then, arsenic ions are implanted with a POS side masked with a resist, while boron ions are implanted with an NMOS side masked with a resist, and thermally processed for diffusing impurities in a gate/drain region and gate electrode.
申请公布号 JP2000208640(A) 申请公布日期 2000.07.28
申请号 JP19990003309 申请日期 1999.01.08
申请人 SONY CORP 发明人 SUZUKI ATSUSHI
分类号 H01L21/8238;H01L21/265;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L21/8238
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