发明名称 SPECTROSCOPIC ANALYSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To measure with a good stability even when a peak of any light intensity is repeatedly measured by setting a diaphragm to an optical path to prevent a detect value stability from being affected by an open time of a mechanism shutter with an exposure time being set equal and, controlling the intensity of light focused to a two-dimensional detector. SOLUTION: A sample is introduced to a light-emitting part 1, thereby emitting light. The light enters a spectroscope via a condenser lens 2, an entrance slit 3 and the like. A divergent luminous flux 5 is reflected by a collimating mirror 6 and enters a diffraction grating 7. Grooves are formed at regular intervals to a surface of the diffraction grating 7. The light hits a order dispersion element 4 and scatters after being dispersed to wavelengths. The light thus dispersed in two dimensions is turned by a camera mirror 9 to a convergent luminous flux 20, reflected and focused to each coordinate of a two-dimensional detector 8. If a light-reducing means 11 is set in an optical path of a parallel luminous flux 14, the light passing the light-reducing means 11 is turned to the circular parallel luminous flux 14 of an equal diameter to an opening part of the means and eventually focused to one point of the two-dimensional detector 8.
申请公布号 JP2000352556(A) 申请公布日期 2000.12.19
申请号 JP19990164337 申请日期 1999.06.10
申请人 SEIKO INSTRUMENTS INC 发明人 MATSUZAWA OSAMU
分类号 G01N21/73;(IPC1-7):G01N21/73 主分类号 G01N21/73
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