| 摘要 |
<p>The timing at which a probe light beam is projected to an optical switch device of a terahertz wave detector for detecting a terahertz wave emitted from a terahertz wave generator and transmitted through a sample is vibratingly varied by driving a movable reflecting part of a variable optical delay device at a predetermined vibration frequency. The detection signal generated thereby and periodically and vibratingly changing is subjected to frequency analysis by a spectrum analyzer of a spectroscopic processing unit. The detection signal has the same temporal waveform as that of a terahertz wave and subjected to scale conversion. Therefore, the frequency analysis of the detection signal enables frequency measurement of a terahertz wave in real time. As a result, real-time spectroscopy is possible and the system configuration is simplified.</p> |
