发明名称 Processing systems with dual ion sources
摘要 A substrate processing system includes a processing chamber, a substrate holder positioned in the chamber, a gas source for supplying a process gas to the chamber, first and second ion sources located in the chamber, and a power source for energizing the first and second ion sources. Each ion source ionizes the process gas to produce ions for processing a substrate disposed on the substrate holder. The first and second ion sources include first and second anodes, respectively. The power source energizes the first and second anodes in a time multiplexed manner, such that only one of the first and second ion sources is energized at any time and interactions between ion sources are eliminated.
申请公布号 US6203862(B1) 申请公布日期 2001.03.20
申请号 US19980076971 申请日期 1998.05.13
申请人 INTEVAC, INC. 发明人 BLUCK TERRY;ROGERS JAMES H.;MCGINNIS SEAN P.
分类号 H05H1/46;B05C21/00;C23C16/26;C23C16/27;C23C16/44;C23C16/50;C23C16/513;G11B5/84;H01J37/317;(IPC1-7):H05H1/00 主分类号 H05H1/46
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