发明名称 PLATE THICKNESS MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To measure highly accurately regardless of the thickness of a measuring object. SOLUTION: This device is equipped with a laser type thickness meter composed by arranging two range finders 2a, 2b for measuring the distance from reflected light by irradiating a laser beam onto the surface of a plate-shaped measuring object 1 which is a target for thickness measurement, oppositely through the measuring object 1, for measuring the thickness of the measuring object 1 by detecting respective distances between each range finder 2a, 2b and the measuring object 1, a radiation thickness meter composed by arranging a radiation generator 6a for generating radiation and a radiation detector 6b for detecting the radiation, oppositely through the measuring object 1, for measuring the thickness of the measuring object 1 by irradiating the radiation from the radiation generator 6a to the measuring object 1 and by detecting a radiation quantity transmitted through the measuring object 1 by the radiation detector 6b, and a means for converting and outputting either of a thickness measured value by the laser type thickness meter and a thickness measured value by the radiation thickness meter as the final thickness measured value based on the thickness of the measuring object 1.
申请公布号 JP2001147116(A) 申请公布日期 2001.05.29
申请号 JP19990331653 申请日期 1999.11.22
申请人 TOSHIBA CORP 发明人 NISHIKAWA MASAMITSU
分类号 G01B11/06;G01B15/02;G01B21/08;(IPC1-7):G01B21/08 主分类号 G01B11/06
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