| 摘要 |
PROBLEM TO BE SOLVED: To detect a voltage applied between main terminals of a semiconductor element directly by using a voltage lower than this voltage. SOLUTION: Five pairs of collector lamp diodes 18-26 are inserted between a collector electrode terminal 12 of an IGBT 10 and a gate electrode terminal 16. A pair of gate protection diodes 28 are inserted between the gate electrode terminal 16 and an emitter electrode terminal 14. A collector voltage detecting terminal 30 is connected to a connection point of collector lamp diodes 24, 26. When a voltage is applied to a collector of the IGBT 10, this voltage is divided by the collector lamp diodes 18-26 and the divided voltages are outputted from the collector voltage detecting terminal 30. That is, the collector voltage can be directly monitored from the collector voltage detecting terminal.
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