发明名称 WAVELENGTH SENSOR AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a wavelength sensor whose degree of the absorption of light with long wavelength differs and which can identify wavelength from the ratio of optical current, by selectively forming a silicon germanium layer whose light absorption coefficient is larger than silicon by not less than 20 times in a part of a silicon photodiode without using dye whose color easily fades. SOLUTION: In a wavelength sensor, silicon germanium layers 4 different in thickness are deposited on plural first conductive silicon layers 1 separated by an insulating film. Second conductive impurity is diffused on the silicon germanium layers 4 and the light of long wavelength is absorbed by the silicon germanium layers 4. Thus, photodiodes 16 can obtain different optical currents with respect to the wavelength of light.
申请公布号 JP2001250975(A) 申请公布日期 2001.09.14
申请号 JP20000059676 申请日期 2000.03.03
申请人 SHARP CORP 发明人 OKADA MASATAKE;KOYAMA JUNICHIRO;FUKUNAGA NAOKI;TANI YOSHIHEI
分类号 H01L31/10;(IPC1-7):H01L31/10 主分类号 H01L31/10
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