发明名称 OXIDIZATION SYSTEM AND ITS CLEANING METHOD
摘要 PROBLEM TO BE SOLVED: To efficiently clean an oxidization system which can selectively oxidize in a low-pressure atmosphere the silicon layer of an object having a silicon layer and a tungsten layer. SOLUTION: In order to clean a metal adhering to the internal surface of the reaction tube 11 of the oxidization system which selectively oxidizes the side wall of the silicon layer of an electrode having a laminated structure of the silicon layer and tungsten layer and a dummy wafer, tungsten and a tungsten compound adhering to the internal surface of the reaction tube 11, a wafer boat 31, and the dummy wafer are removed by supplying a halogen-based gas, such as HCl, etc., and oxygen into the reaction tube 11 through a cleaning gas introducing port 43.
申请公布号 JP2001250818(A) 申请公布日期 2001.09.14
申请号 JP20000401828 申请日期 2000.12.28
申请人 TOKYO ELECTRON LTD 发明人 SUEMURA ASAMI;AOKI KIMIYA
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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