发明名称 Circuit configuration for burn-in systems for testing modules by using a board
摘要 A burn-in system uses a board for testing modules disposed like a matrix in the board. A circuit configuration includes module terminals for the modules in the board. Input/output channels are each connected to a respective one of the module terminals. Diodes are each connected to a respective one of the input/output channels. A scan signal terminal is connected to the diodes for activating the module terminals in groups with scan signals.
申请公布号 US6292008(B1) 申请公布日期 2001.09.18
申请号 US19990322717 申请日期 1999.05.28
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SILLUP JOSEPH;WEBER FRANK
分类号 G11C29/56;G01R31/3185;H01L21/66;(IPC1-7):G01R31/26 主分类号 G11C29/56
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