发明名称 |
Circuit configuration for burn-in systems for testing modules by using a board |
摘要 |
A burn-in system uses a board for testing modules disposed like a matrix in the board. A circuit configuration includes module terminals for the modules in the board. Input/output channels are each connected to a respective one of the module terminals. Diodes are each connected to a respective one of the input/output channels. A scan signal terminal is connected to the diodes for activating the module terminals in groups with scan signals.
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申请公布号 |
US6292008(B1) |
申请公布日期 |
2001.09.18 |
申请号 |
US19990322717 |
申请日期 |
1999.05.28 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
SILLUP JOSEPH;WEBER FRANK |
分类号 |
G11C29/56;G01R31/3185;H01L21/66;(IPC1-7):G01R31/26 |
主分类号 |
G11C29/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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