| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe for measuring electronic parts with which measurement can be performed smoothly at every terminal without requiring such a procedure that turns off the power supply every time at the time of measuring a plurality of terminals. SOLUTION: This probe has a measuring section in which a contact elastically comes into contact with the plurality of terminals of electronic parts by moving perpendicularly to the arranging direction of the terminals when the probe selectively comes into contact and does not come into contact with the terminals. Therefore, when the measuring section is fixed relatively to the electronic parts, the measurement can be performed smoothly by smoothly bringing the probe into contact with the terminals of the parts without turning off the power supply every time.
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