发明名称 |
IMPEDANCE MEASURING METHOD BY FOUR-TERMINAL METHOD |
摘要 |
PROBLEM TO BE SOLVED: To prevent an induced voltage which causes a measurement error from being generated on a voltage probe side by a magnetic field produced at a current probe. SOLUTION: For an impedance measuring method by a four-terminal method using 1st and 2nd voltage probes 11 and 12 and 1st and 2nd current probes 21 and 22, a conductive substrate 3 is arranged on the reverse side of a circuit board (measured body) 3 and 3rd and 4th current probes 23 and 24 are arranged along the 1st and 2nd current probes 21 and 22 and then made to probe the conductive substrate 3, thereby supplying a cancel current CI by a measurement current I in such a direction that magnetic fields produced at the 1st and 2nd current probes 21 and 22 are canceled.
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申请公布号 |
JP2001281280(A) |
申请公布日期 |
2001.10.10 |
申请号 |
JP20000096238 |
申请日期 |
2000.03.31 |
申请人 |
HIOKI EE CORP |
发明人 |
SATO YOSHINORI;MURAYAMA RINTARO |
分类号 |
G01R1/073;G01R27/02;(IPC1-7):G01R27/02;//G01R1/0 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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