发明名称 Apparatus and method of correcting layout pattern data, method of manufacturing semiconductor devices and recording medium
摘要 The invention provides an apparatus and a method of correcting layout pattern. The apparatus has a deletion region side extracting section for extracting sides of a region to be deleted having a predetermined shape such as protrusion, notch or step in a layout pattern of a circuit, a deletion-use pattern generator for generating a deletion-use pattern based on the extracted sides, and an operating section for executing a predetermined operation to the layout pattern with the deletion-use pattern so as to remove the region to be deleted from the original layout pattern.
申请公布号 US2002007481(A1) 申请公布日期 2002.01.17
申请号 US20010810504 申请日期 2001.03.19
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ONO YUSAKU
分类号 G03F1/08;G03F1/14;G03F1/36;G03F1/68;G03F1/70;G03F7/20;G06F17/50;H01L21/027;H01L21/82;(IPC1-7):G06F17/50 主分类号 G03F1/08
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