发明名称 |
Apparatus and method of correcting layout pattern data, method of manufacturing semiconductor devices and recording medium |
摘要 |
The invention provides an apparatus and a method of correcting layout pattern. The apparatus has a deletion region side extracting section for extracting sides of a region to be deleted having a predetermined shape such as protrusion, notch or step in a layout pattern of a circuit, a deletion-use pattern generator for generating a deletion-use pattern based on the extracted sides, and an operating section for executing a predetermined operation to the layout pattern with the deletion-use pattern so as to remove the region to be deleted from the original layout pattern. |
申请公布号 |
US2002007481(A1) |
申请公布日期 |
2002.01.17 |
申请号 |
US20010810504 |
申请日期 |
2001.03.19 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
ONO YUSAKU |
分类号 |
G03F1/08;G03F1/14;G03F1/36;G03F1/68;G03F1/70;G03F7/20;G06F17/50;H01L21/027;H01L21/82;(IPC1-7):G06F17/50 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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