发明名称 DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR APPARATUS
摘要 PURPOSE: A semiconductor manufacturing device and a method thereof are provided to improve the mobility in the peripheral circuit region, and to perform the high speed driving by making transistor characteristics uniform at high level. CONSTITUTION: An a-Si film(2) is patterned into the linear shape(ribbon shape) or island shape on a glass substrate(1). The upper surface of the a-Si film or the lower surface of the glass substrate is irradiated and scanned with an energy beam in the direction indicated by an arrow. The energy beam is output continuously along the time axis from a CW laser(3), and the a-Si film is crystallized by irradiating and scanning the energy beam. The transistor characteristics of a TFT(Thin Film Transistor) are made uniform at high level, and the mobility is high particularly in a peripheral circuit area for high speed driving.
申请公布号 KR20020016585(A) 申请公布日期 2002.03.04
申请号 KR20010051354 申请日期 2001.08.24
申请人 FUJITSU LIMITED 发明人 HARA AKITO;SASAKI NOBUO;TAKEUCHI FUMIYO;YOSHINO KENICHI
分类号 G02F1/1345;G02F1/136;H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):G02F1/136 主分类号 G02F1/1345
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