发明名称 CLEANING DEVICE AND METHOD FOR CLEANING WAFER AFTER POLISHING
摘要 PROBLEM TO BE SOLVED: To provide a cleaning device and a method with which the cleaning efficiency of the wafer surface is still increased more, and the diffusion of the cleaning liquid and the like can be prevented effectively. SOLUTION: The diffusion of the cleaning liquid to the outer space of the device can be prevented. Also, the residue of cleaning liquid or the like on the surface of the silicon wafer can be reduced drastically, by orienting the cleaning surface of the silicon wafer downward and the cleaning efficiency can be improved.
申请公布号 JP2002110602(A) 申请公布日期 2002.04.12
申请号 JP20000301147 申请日期 2000.09.29
申请人 KOMATSU ELECTRONIC METALS CO LTD;KOMATSU LTD 发明人 MIYAGAWA SEIJI;MIZOWAKI KOJI;HIROZAWA ATSUHIKO;KIKUCHI MASAO;NISHI YOZO;KAMEI TOSHIYUKI;KOBIKI YASUHIRO
分类号 B08B1/04;B08B3/02;B08B3/12;B08B7/04;H01L21/304;(IPC1-7):H01L21/304 主分类号 B08B1/04
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