发明名称 Uniform height tall fins with varying silicon germanium concentrations
摘要 A method of making a semiconductor device includes forming a first fin in a first semiconducting material layer disposed over a substrate, the first semiconducting material layer comprising an element in a first concentration; and forming a second fin in a second semiconducting material layer disposed over the substrate and adjacent to the first semiconducting material layer, the second semiconducting material layer comprising the element in a second concentration; wherein the first concentration is different than the second concentration.
申请公布号 US9502540(B1) 申请公布日期 2016.11.22
申请号 US201514968313 申请日期 2015.12.14
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Bedell Stephen W.;Doris Bruce B.;Fogel Keith E.;Reznicek Alexander
分类号 H01L21/02;H01L29/66;H01L21/306;H01L21/308;H01L21/324 主分类号 H01L21/02
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP ;Alexanian Vazken
主权项 1. A method of making a semiconductor device, the method comprising: etching trenches in a semiconducting material disposed over a substrate to form a first active area and a second active area in the semiconducting material, the first active area being adjacent to the second active area; recessing the semiconducting material of the first active area and the second active area to different depths; growing a first epitaxial layer over the semiconducting material of the first active area and a second epitaxial layer over the semiconducting material of the second active area, the first epitaxial layer and the second epitaxial layer comprising a common element; performing a thermal mixing process to merge the first epitaxial layer with the semiconducting material of the first active area, distribute the common element of the first epitaxial layer within the semiconducting material of the first active area, and form a first merged active area comprising the first epitaxial layer and the semiconducting material of the first active area; and to merge the second epitaxial layer with the semiconducting material of the second active area, distribute the common element of the second epitaxial layer within the semiconducting material of the second active area, and form a second merged active area comprising the second epitaxial layer and the semiconducting material of the second active area, the first merged active area and the second merged active area comprising the common element in different concentrations; forming a first fin in the first merged active area; and forming a second fin in the second merged active area.
地址 Armonk NY US