| 摘要 |
PROBLEM TO BE SOLVED: To provide an integrated circuit testing device and its method capable of shortening the time required for testing a manufactured integrated circuit so as to lower the manufacturing cost for the integrated circuit. SOLUTION: A test program storage part 24 stores a program realizing a plurality of test items, and a condition setting part 10 sets allowance information allowing omission of at least one test item to a plurality of tested circuits included in a lot. A test controlling device 20 performs a test while using at least one tested circuit in the lot as a sample, and on the basis of the result of the test on this sample, a test on a tested circuit other than the sample is omitted as to the test item for which the allowance information is set by the condition setting part 10.
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