发明名称 |
SEMICONDUCTOR DEVICE WITH REDUCED LINE-TO-LINE CAPACITANCE AND CROSS TALK NOISE |
摘要 |
A transistor device (200) is disclosed, having an insulating material disposed between the gate electrode (204) and the drain and source lines, wherein the dielectric constant of the insulating amterial is 3.5 or less. Accodingly, the capacitance between the gate electrode and the drain and source lines can be reduced, thereby improving signal performance of the field effect transistor (200) with decreased cross talk noise. |
申请公布号 |
WO0241405(A1) |
申请公布日期 |
2002.05.23 |
申请号 |
WO2001US31199 |
申请日期 |
2001.10.04 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
HORSTMANN, MANFRED;WIECZOREK, KARSTEN;HAUSE, FREDERICK, N. |
分类号 |
H01L29/43;H01L21/28;H01L21/336;H01L23/532;H01L29/417;H01L29/49;H01L29/78;H01L29/786 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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