发明名称 Design rule checking tools and methods that use waiver layout patterns to waive unwanted dimensional check violations
摘要 A design rule checking (DRC) tool performs DRC operations by determining a match between one of a plurality of waiver layout patterns and a first portion of an integrated circuit layout containing a suspected violation of a first design rule. This operation is preferably performed automatically during a comprehensive DRC operation on the entire integrated circuit layout. Each violation of a design rule within an integrated circuit layout is preferably treated initially as a "suspected" violation prior to an operation to compare one or more different waiver layout patterns to the portion of the integrated circuit containing the "suspected" violation. A failure to identify a match with any of the waiver layout patterns operates to convert the "suspected" violation into a "confirmed" violation. At the end of the comprehensive DRC operation, separate files may be generated that list each of the occurrences of the suspected violations that have been waived and the confirmed violations that have not been waived.
申请公布号 US6418551(B1) 申请公布日期 2002.07.09
申请号 US20000715342 申请日期 2000.11.17
申请人 AVANT! CORPORATION 发明人 MCKAY KERSTIN KAY;AMMON MARK PRESTON;GRABSKI MARK ALAN
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
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