发明名称 EDDY CURRENT FLAW DETECTION PROBE
摘要 PROBLEM TO BE SOLVED: To accurately detect a flaw in an eddy current flaw detection probe. SOLUTION: This probe for detecting the flaw in a test body 10 has plural excitation coils 22a-22h generating an AC magnetic field to generate an eddy current in the test body 10, and plural thin film-like detection coils 21a-21h overlapped in an upper-and-lower double-layer state and arranged in a line.
申请公布号 JP2002221514(A) 申请公布日期 2002.08.09
申请号 JP20020011872 申请日期 2002.01.21
申请人 MITSUBISHI HEAVY IND LTD 发明人 KUROKAWA MASAAKI;MATSUMOTO MITSUYOSHI
分类号 G01N27/90;(IPC1-7):G01N27/90 主分类号 G01N27/90
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