发明名称 |
EDDY CURRENT FLAW DETECTION PROBE |
摘要 |
PROBLEM TO BE SOLVED: To accurately detect a flaw in an eddy current flaw detection probe. SOLUTION: This probe for detecting the flaw in a test body 10 has plural excitation coils 22a-22h generating an AC magnetic field to generate an eddy current in the test body 10, and plural thin film-like detection coils 21a-21h overlapped in an upper-and-lower double-layer state and arranged in a line.
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申请公布号 |
JP2002221514(A) |
申请公布日期 |
2002.08.09 |
申请号 |
JP20020011872 |
申请日期 |
2002.01.21 |
申请人 |
MITSUBISHI HEAVY IND LTD |
发明人 |
KUROKAWA MASAAKI;MATSUMOTO MITSUYOSHI |
分类号 |
G01N27/90;(IPC1-7):G01N27/90 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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