发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To form a homogeneous silicide layer that less produces a defect such as a junction leak. SOLUTION: A method for manufacturing a semiconductor device includes a preheating step of heating the surface of a silicon layer during formation of a metal film, when the metal film is formed on the silicon layer and then the silicon layer is heated to make the metal film react with the silicon layer and to form the silicide layer on the silicon layer.
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申请公布号 |
JP2002237470(A) |
申请公布日期 |
2002.08.23 |
申请号 |
JP20010032721 |
申请日期 |
2001.02.08 |
申请人 |
SHARP CORP |
发明人 |
KISHI AKIRA;INUZUKA HIROYUKI;SUEYOSHI YASUHIKO |
分类号 |
H01L21/28;H01L21/336;H01L21/8238;H01L27/092;H01L29/78;(IPC1-7):H01L21/28;H01L21/823 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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